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In addition, distorted or non-sine wave signals can cause measurement inaccuracies.
The signal consists of the timing variation due to the target exponent bit, and noise results from measurement inaccuracies and timing variations due to unknown exponent bits.
In addition, the measurement inaccuracy increases with a high surface fracture toughness resulting in a smaller crack length or broken wafers at the blade insertion as well as the influence of the fourth power of the measured crack length.
For example, when setting a test limit for a measurement on each manufactured item of some type, to assure that no bad items are shipped, the limit must be tighter than the requirement to allow for the worst case sum of measurement inaccuracies (e.g. equipment, test fixture etc.).